| タイトル | Specimen Holder for Analytical Electron Microscopes |
| 著者（英） | Isaacs, A. M.; Mackinnon, I.; Clanton, U. S. |
| 著者所属（英） | NASA Johnson Space Center |
| 発行日 | 1985-04-01 |
| 言語 | eng |
| 内容記述 | Reduces spectral contamination by spurious X-ray. Specimen holder made of compressed carbon, securely retains standard electron microscope grid (disk) 3 mm in diameter and absorbs backscattered electrons that otherwise generate spurious X-rays. Since holder inexpensive, dedicated to single specimen when numerous samples examined. |
| NASA分類 | MECHANICS |
| レポートNO | 84B10331
MSC-20398 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/401676 |
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