| タイトル | Texas Instruments' virtual phase charge-coupled device (CCD) imager operated in the frontside electron-bombarded mode |
| 著者（英） | Lowrance, J.; Hynecek, J.; Everett, P.; Zucchino, P. |
| 著者所属（英） | Texas Instruments, Inc.|Princeton Univ. |
| 発行日 | 1982-01-01 |
| 言語 | eng |
| 内容記述 | The present investigation is concerned with the suitability of the virtual phase CCD imager for frontside detection of electrons up to 25 keV. The investigation has the objective to determine if the imager can be used in the frontside mode with a photocathode to detect very low light levels in astronomical applications, the ultimate goal being individual photon detection. It is found that the standard virtual phase imager will function properly over an extended period at low levels of 20 kV electron irradiation consistent with photon counting applications. The imager can detect individual primary electrons with nearly 100 percent efficiency. However, further studies are needed to determine the mechanisms for the flat band shifts so that the imager design may be modified to eliminate or at least reduce them. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 83A31995 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/404299 |
