| タイトル | Single event upset sensitivity of low power Schottky devices |
| 著者（英） | Wahlin, K. L.; Price, W. E.; Nichols, D. K.; Measel, P. R. |
| 著者所属（英） | Boeing Aerospace Co.|Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1982-12-01 |
| 言語 | eng |
| 内容記述 | Data taken from tests involving heavy ions in the Berkeley 88 in. cyclotron being directed at low power Schottky barrier devices are reported. The tests also included trials in the Harvard cyclotron with 130 MeV protons, and at the U.C. Davis cyclotron using 56 MeV protons. The experiments were performed to study the single event upsets in MSI logic devices containing flip-flops. Results are presented of single-event upsets (SEU) causing functional degradation observed in post-exposure tests of six different devices. The effectiveness of the particles in producing SEUs in logic device functioning was found to be directly proportional to the proton energy. Shielding was determined to offer negligible protection from the particle bombardment. The results are considered significant for the design and fabrication of LS devices for space applications. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 83A17542 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/406012 |
