| タイトル | On the statistical uncertainties associated with line profile fitting |
| 著者（英） | Roussel-Dupre, R.; Tanigawa, G.; Landman, D. A. |
| 著者所属（英） | Hawaii Univ. |
| 発行日 | 1982-10-15 |
| 言語 | eng |
| 内容記述 | The paper considers the statistical uncertainties in the best-fit parameters associated with the fitting of observational data by model line profiles of specific form. The parameters involved are amplitude, center, and width. A general procedure is described for any profile type of parametric form. The case of Gaussian profiles is treated in detail, and numerical solutions are presented for equally spaced data of equal weight. Approximate analytical solutions are derived that give good general agreement with the numerical solutions over the whole range of interest. Approximate solutions are also obtained for the case of Lorentzian profiles. It is shown that the Lorentzian results can be used in conjunction with the Gaussian results to estimate the corresponding parameter uncertainties in the case of the general Voigt profile. |
| NASA分類 | ASTROPHYSICS |
| レポートNO | 83A11607 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/406982 |
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