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タイトルEvaluation of charge control techniques on spacecraft thermal surfaces (electrostatic discharge study)
著者(英)Pack, G. J.; Dulgeroff, C. R.; Conan, S. M.; Shannon, D. L.; Robinson, P. A., Jr.; Lawton, L. C.; Holm, G. J.; Brown, E. M.; Elkman, W. R.
著者所属(英)Hughes Research Labs.
発行日1980-10-01
言語eng
内容記述The charging and discharging characteristics of various dielectric materials commonly used on spacecraft were tested. The experimental apparatus and the calculations used to analyze the data generated during the testing are described. The test technique, results, and analysis used are presented. Indium tin oxide coated Teflon, Kapton, and quartz do not charge significantly. CTL 15 white paint shows no large charge build up. Pinholes in Teflon and Kapton increase the leakage through the sample and reduce the energy released in an arc. Conductive grids in Teflon and Kapton reduce the arc energy by two orders of magnitude over untreated samples. Extreme low temperatures (-195 C) do not significantly increase the arc energy of the gridded sample.
NASA分類SPACECRAFT DESIGN, TESTING AND PERFORMANCE
レポートNO82N14235
権利No Copyright


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