| タイトル | Electron-beam-charged dielectrics: Internal charge distribution |
| 著者（英） | Pine, V. W.; Beers, B. L. |
| 著者所属（英） | Beers Associates, Inc. |
| 発行日 | 1981-10-01 |
| 言語 | eng |
| 内容記述 | Theoretical calculations of an electron transport model of the charging of dielectrics due to electron bombardment are compared to measurements of internal charge distributions. The emphasis is on the distribution of Teflon. The position of the charge centroid as a function of time is not monotonic. It first moves deeper into the material and then moves back near to the surface. In most time regimes of interest, the charge distribution is not unimodal, but instead has two peaks. The location of the centroid near saturation is a function of the incident current density. While the qualitative comparison of theory and experiment are reasonable, quantitative comparison shows discrepancies of as much as a factor of two. |
| NASA分類 | SPACECRAFT DESIGN, TESTING AND PERFORMANCE |
| レポートNO | 82N14215 |
| 権利 | No Copyright |
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