タイトル | Capacitor DPA: Does it do any good? |
著者(英) | Porter, D. C. |
著者所属(英) | Boeing Aerospace Co. |
発行日 | 1981-06-01 |
言語 | eng |
内容記述 | Methods of destructive physical analysis (DPA) are suggested which might have more usefulness if the procedures followed lines of accelerated testing. A brief presentation of DPA procedures is followed by a discussion of their value. |
NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
レポートNO | 81N26391 |
権利 | No Copyright |
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