| タイトル | Relationship of spectral data to grain yield variation |
| 著者（英） | Elgin, J. H., Jr.; Holben, B. N.; Tucker, C. J.; Mcmurtrey, J. E., III |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 1980-05-01 |
| 言語 | eng |
| 内容記述 | Two-band hand-held radiometer data from a winter wheat field, collected on 21 dates during the spring growing season, were correlated with within-field final grain yield. Significant linear relationships were found between various combinations of the red and photographic infrared radiance data collected and the grain yield. The spectral data explained about 64 percent of the within-field grain yield variation. This variation in grain yield could not be explained using meteorological data as these were similar for all areas of the wheat field. Most importantly, data collected early in the spring were highly correlated with grain yield, a five-week time window existed from stem elongation through anthesis in which the spectral data were most highly correlated with grain yield, and manifestations of wheat canopy water stress were readily apparent in the spectral data. |
| NASA分類 | EARTH RESOURCES AND REMOTE SENSING |
| レポートNO | 80A35300 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/421837 |
|
