| タイトル | Initial comparison of SSPM ground test results and flight data to NASCAP simulations |
| 著者（英） | Stevens, N. J.; Staskus, J. V.; Mizera, P. F.; Roche, J. C. |
| 著者所属（英） | Aerospace Corp.|NASA Lewis Research Center |
| 発行日 | 1980-01-01 |
| 言語 | eng |
| 内容記述 | The satellite surface potential monitor (SSPM) has been developed for the P78-2 SCATHA (Spacecraft Charging At The High Altitudes) satellite to determine the response of selected spacecraft materials to charged-particle environmental fluxes. Since the monitor infers total surface voltages from a single point on the interior side of insulators, a ground simulation program was undertaken to develop analytical techniques to model the monitors and to obtain an experimental calibration of the relationship between the flight measurement techniques and actual measurements. The experimental testing was conducted using monoenergetic electron beams irradiating samples in the dark. An analytical computer model was developed in the NASCAP (NASA Charging Analyzer Program) code. The analytical model material properties for Kapton that controlled backscatter and secondary yield were adjusted to obtain a single set of values that produced reasonable fits for both voltages and currents. The analytical techniques developed in the ground technology investigation have been applied to space flight conditions. Predictions were compared with limited flight data. The agreement is very good indicating that the technique, and NASCAP, can be used to predict spacecraft material charging behavior. Details of the testing, the analytical modelling technique and flight data comparisons are presented. |
| NASA分類 | SPACECRAFT INSTRUMENTATION |
| レポートNO | 80A29751
AIAA PAPER 80-0336 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/422229 |
