| タイトル | Conductive surge testing of circuits and systems |
| 著者（英） | Richman, P. |
| 著者所属（英） | NASA Langley Research Center |
| 発行日 | 1980-04-01 |
| 言語 | eng |
| 内容記述 | Techniques are given for conductive surge testing of powered electronic equipment. The correct definitions of common and normal mode are presented. Testing requires not only spike-surge generators with a suitable range of open-circuit voltage and short-circuit current waveshapes, but also appropriate means, termed couplers, for connecting test surges to the equipment under test. Key among coupler design considerations is minimization of fail positives resulting from reduction in delivered surge energy due to the coupler. Back-filters and the lines on which they are necessary, are considered as well as ground-fault and ground potential rise. A method for monitoring delivered and resulting surge waves is mentioned. |
| NASA分類 | METEOROLOGY AND CLIMATOLOGY |
| レポートNO | 80N21945 |
| 権利 | No Copyright |
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