| タイトル | Global lunar crust - Electrical conductivity and thermoelectric origin of remanent magnetism |
| 著者（英） | Daily, W. D.; Parkin, C. W.; Dyal, P. |
| 著者所属（英） | Eyring Research Inst.|Santa Clara Univ.|NASA Ames Research Center |
| 発行日 | 1977-01-01 |
| 言語 | eng |
| 内容記述 | An upper limit is placed on the average crustal conductivity from an investigation of toroidal (V x B) induction in the moon, using ten-minute data intervals of simultaneous lunar orbiting and surface magnetometer data. Crustal conductivity is determined as a function of crust thickness. For an average global crust thickness of about 80 km, the crust surface electrical conductivity is of the order of 1 hundred millionth mho/m. The toroidal-induction results lower the surface-conductivity limit obtained from poloidal-induction results by approximately four orders of magnitude. In addition, a thermoelectric (Seebeck effect) generator model is presented as a magnetic-field source for thermoremanent magnetization of the lunar crust during its solidification and cooling. Magnetic fields from 1000 to 10,000 gammas are calculated for various crater and crustal geometries. Solidified crustal material cooling through the iron Curie temperature in the presence of such ancient lunar fields could have received thermoremanent magnetization consistent with that measured in most returned lunar samples. |
| NASA分類 | LUNAR AND PLANETARY EXPLORATION |
| レポートNO | 78A41601 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/432231 |
