| タイトル | Factors affecting laser-trim stability of thick film resistors |
| 著者（英） | Cote, R. E.; Headley, R. C. |
| 著者所属（英） | Du Pont de Nemours (E. I.) and Co. |
| 発行日 | 1977-11-01 |
| 言語 | eng |
| 内容記述 | Various factors affecting precision of trim and resistor stability were considered. The influence of machine operating parameters on resistor performance was examined and quantified through statistically designed experiments for a Q switched YAG laser system. Laser kerf quality was studied by scanning electron microscopy and related to kerf isolation resistance measurements. A relatively simple production oriented, quality control test is proposed for rapid determination of kerf electrical stability. In addition, the effect of cut design and extent of trim on precision and stability were discussed. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 78N16278 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/435415 |
