| タイトル | Pressure perturbation in EHD contacts due to an ellipsoidal asperity |
| 著者（英） | Chow, L. S. H.; Cheng, H. S. |
| 著者所属（英） | Argonne National Lab.|Northwestern Univ. |
| 発行日 | 1975-10-01 |
| 言語 | eng |
| 内容記述 | The pressure fluctuations around an ellipsoidal asperity tip at the inlet region of an elastohydrodynamic contact is determined by solving a perturbed Reynolds equation assuming that the asperity shape is unaffected by the perturbed pressure. Results are presented as the amplitude of the perturbed pressure as a function of ellipticity ratio, maximum Hertzian pressure, nominal EHD film thickness, asperity size, asperity height, and pressure viscosity coefficient. For the case of simple sliding between a smooth surface and a stationary asperity, a comparison is also made between the results for large ellipticity ratios and the pressure fluctuations obtained by using a previous line contact EHD analysis for a two-dimensional asperity ridge. The agreement is found to be close for moderate Hertzian pressure and relatively thick EHD film thickness. |
| NASA分類 | MECHANICAL ENGINEERING |
| レポートNO | 76A14857
ASME PAPER 75-LUB-2 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/444809 |
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