| タイトル | Some new techniques for processing remotely obtained images by self-generated spectral masks. |
| 著者（英） | Lee, D.; Stark, H.; Barker, R. C. |
| 発行日 | 1972-11-01 |
| 言語 | eng |
| 内容記述 | An extension of a new technique that makes possible parallel, simultaneous processing of remotely obtained images is presented. The technique holds out promise for automatic onboard classification of data. The central feature involves the generation of binary masks, directly from the image, based on object reflectance data, that group objects into equivalence classes. These masks, called equivalence class masks, can be used in various logical combinations to isolate classes of objects with a priori known reflectance or radiance signatures. Experimental verification of the technique is furnished for simple scenes. A computational scheme, based on a sequence of integrated irradiance measurements on the image, that makes it possible to identify objects within an equivalence class is suggested. |
| NASA分類 | PHYSICS, GENERAL |
| レポートNO | 73A11219 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/459815 |
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