| タイトル | Evidence of crystal structure in some sputtered MoS2 films. |
| 著者（英） | Lavik, M. T.; Campbell, M. E. |
| 発行日 | 1972-07-01 |
| 言語 | eng |
| 内容記述 | Electron diffraction patterns and electron micrographs of molybdenum disulfide films sputtered on single-NaCl-crystal and electropolished-aluminum substrates are presented as evidence that crystalline MoS2 films can be sputtered onto various substrates in thicknesses up to 2 microns. Applied to Falex test pins and V-blocks, some of these films exhibited a wear life as long as 65 minutes at 1000 lb jaw load. |
| NASA分類 | MATERIALS, NONMETALLIC |
| レポートNO | 72A37897 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/461244 |
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