| タイトル | Techniques for control of long-term reliability of complex integrated circuits. I - Reliability assurance by test vehicle qualification. |
| 著者（英） | Van Vonno, N. W. |
| 発行日 | 1972-01-01 |
| 言語 | eng |
| 内容記述 | Development of an alternate approach to the conventional methods of reliability assurance for large-scale integrated circuits. The product treated is a large-scale T squared L array designed for space applications. The concept used is that of qualification of product by evaluation of the basic processing used in fabricating the product, providing an insight into its potential reliability. Test vehicles are described which enable evaluation of device characteristics, surface condition, and various parameters of the two-level metallization system used. Evaluation of these test vehicles is performed on a lot qualification basis, with the lot consisting of one wafer. Assembled test vehicles are evaluated by high temperature stress at 300 C for short time durations. Stressing at these temperatures provides a rapid method of evaluation and permits a go/no go decision to be made on the wafer lot in a timely fashion. |
| NASA分類 | ELECTRONIC EQUIPMENT |
| レポートNO | 72A34686 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/461594 |
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