| タイトル | Fast-interface-state losses in charge-coupled devices. |
| 著者（英） | Carnes, J. E.; Kosonocky, W. F. |
| 発行日 | 1972-04-01 |
| 言語 | eng |
| 内容記述 | A simple model is presented that makes it possible to predict signal losses in charge-coupled devices due to fast-interface-state trapping. Presented experimental losses in a twelve-bit two-phase charge-coupled device with overlapping Si and Al gates are shown to agree well with the prediction of the model. |
| NASA分類 | PHYSICS, SOLID-STATE |
| レポートNO | 72A24625 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/462709 |
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