タイトル | Fast-interface-state losses in charge-coupled devices. |
著者(英) | Carnes, J. E.; Kosonocky, W. F. |
発行日 | 1972-04-01 |
言語 | eng |
内容記述 | A simple model is presented that makes it possible to predict signal losses in charge-coupled devices due to fast-interface-state trapping. Presented experimental losses in a twelve-bit two-phase charge-coupled device with overlapping Si and Al gates are shown to agree well with the prediction of the model. |
NASA分類 | PHYSICS, SOLID-STATE |
レポートNO | 72A24625 |
権利 | Copyright |
URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/462709 |
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