タイトル | Polarization dependence of resonant soft X-ray emission spectra in C[lc]eR[lc]h3 |
その他のタイトル | CeRh3における共鳴軟X線放射の偏極依存性 |
著者(日) | 渡邊 正満; 江口 律子; 石渡 洋一; 原田 慈久; 竹内 智之; Shin, Shik |
著者(英) | Watanabe, Masamitsu; Eguchi, Ritsuko; Ishiwata, Yoichi; Harada, Yoshihisa; Takeuchi, Tomoyuki; Shin, Shik |
著者所属(日) | 理化学研究所; 東京大学物性研究所; 東京大学物性研究所; 理化学研究所; 東京理科大学 理学部; 理化学研究所 |
著者所属(英) | Institute of Physical and Chemical Research; Institute for Solid State Physics, University of Tokyo; Institute for Solid State Physics, University of Tokyo; Institute of Physical and Chemical Research; Science University of Tokyo Faculty of Science; Institute of Physical and Chemical Research |
発行日 | 2002-11 |
刊行物名 | Activity Report of Synchrotron Radiation Laboratory 2001 Activity Report of Synchrotron Radiation Laboratory 2001 |
開始ページ | 92 |
終了ページ | 93 |
刊行年月日 | 2002-11 |
言語 | eng |
抄録 | Resonant soft x-ray emission spectroscopy (RXES) has been performed in order to investigate electronic structure of CeRh3 using the photon energy range of Ce 3d to 4f absorption. The polarization dependence of the RXES spectra shows information of concerning electronic states. The spectra display broad energy-loss peak as a hybridized electronic states between 4f(sup 0) and 4f(sup 1)nu configurations, while there are sharp peaks in case of CeO2. The origin of the broad energy-loss peak is attributed to hybridized states involving electron-hole pairs. |
キーワード | RXES; CeRh3; polarization; electronic structure; photoelectron; electron-hole pair; energy loss; absorption threshold; research and development; RXES; CeRh3; 偏極; 電子構造; 光電子; 電子・ホール対; エネルギー損失; 吸収しきい値; 研究開発 |
資料種別 | Technical Report |
SHI-NO | AA0035973007 |
URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/47403 |