タイトル | Tandem-scanning reflected-light microscope. |
著者(英) | Galambos, R.; Egger, M. D.; Petran, M.; Hadravsky, M. |
発行日 | 1968-05-01 |
言語 | eng |
内容記述 | Microscope using tandem scanning of reflected light for image contrast and sharpness for semitransparent materials |
NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
レポートNO | 68A29662 |
権利 | Copyright |
URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/482820 |
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