| タイトル | Mechanisms of ionizing radiation surface effects on transistors. |
| 著者（英） | Nelson, D. L.; Sweet, R. J. |
| 発行日 | 1966-12-01 |
| 言語 | eng |
| 内容記述 | Ionizing radiation effects on silicon planar bipolar transistors determine degradation mechanisms |
| NASA分類 | ELECTRONIC EQUIPMENT |
| レポートNO | 67A15707 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/489052 |
|
