| タイトル | The pulse-sampling technique for the study of electron-attachment phenomena. |
| 著者(英) | Wentworth, W. E.; Lovelock, J. E.; Chen, E. |
| 発行日 | 1966-02-01 |
| 言語 | eng |
| 内容記述 | Electron capture detector parameters in pulse sampling mode analyzed, noting kinetic processes, temperature effect, etc |
| NASA分類 | PHYSICS, ATOMIC, MOLECULAR, AND NUCLEAR |
| レポートNO | 66A32660 |
| 権利 | Copyright |
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