| タイトル | Probe Station and Near-Field Scanner for Testing Antennas |
| 本文（外部サイト） | http://hdl.handle.net/2060/20110013603 |
| 著者（英） | Darby, William G.; Barr, Philip J.; Lambert, Kevin; Lee, Richard Q.; Zaman, Afroz; Miranda, Felix A. |
| 著者所属（英） | NASA Glenn Research Center |
| 発行日 | 2006-10-01 |
| 言語 | eng |
| 内容記述 | A facility that includes a probe station and a scanning open-ended waveguide probe for measuring near electromagnetic fields has been added to Glenn Research Center's suite of antenna-testing facilities, at a small fraction of the cost of the other facilities. This facility is designed specifically for nondestructive characterization of the radiation patterns of miniaturized microwave antennas fabricated on semiconductor and dielectric wafer substrates, including active antennas that are difficult to test in traditional antenna-testing ranges because of fragility, smallness, or severity of DC-bias or test-fixture requirements. By virtue of the simple fact that a greater fraction of radiated power can be captured in a near-field measurement than in a conventional far-field measurement, this near-field facility is convenient for testing miniaturized antennas with low gains. |
| NASA分類 | Quality Assurance and Reliability |
| レポートNO | LEW-17877-1 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/499324 |
