| タイトル | Internal Electrostatic Discharge Monitor - IESDM |
| 本文（外部サイト） | http://hdl.handle.net/2060/20110011958 |
| 著者（英） | Jun, Insoo; Garrett, Henry B.; Goebel, Dan M.; Kim, Wousik |
| 著者所属（英） | California Inst. of Tech. |
| 発行日 | 2011-04-01 |
| 言語 | eng |
| 内容記述 | A document discusses an innovation designed to effectively monitor dielectric charging in spacecraft components to measure the potential for discharge in order to prevent damage from internal electrostatic discharge (IESD). High-energy electrons penetrate the structural materials and shielding of a spacecraft and then stop inside dielectrics and keep accumulating. Those deposited charges generate an electric field. If the electric field becomes higher than the breakdown threshold (approx. =2 x 10(exp 5) V/cm), discharge occurs. This monitor measures potentials as a function of dielectric depth. Differentiation of potential with respect to the depth yields electric field. Direct measurement of the depth profile of the potential in a dielectric makes real-time electronic field evaluation possible without simulations. The IESDM has been designed to emulate a multi-layer circuit board, to insert very thin metallic layers between the dielectric layers. The conductors serve as diagnostic monitoring locations to measure the deposited electron-charge and the charge dynamics. Measurement of the time-dependent potential of the metal layers provides information on the amount of charge deposited in the dielectrics and the movement of that charge with time (dynamics). |
| NASA分類 | Technology Utilization and Surface Transportation |
| レポートNO | NPO-47347 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/499721 |
