| タイトル | Thin spray film thickness measuring technique |
| 本文（外部サイト） | http://hdl.handle.net/2060/19710000061 |
| 著者（英） | Kurtz, G. W.; Jones, G. |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 1971-04-01 |
| 言語 | eng |
| 内容記述 | Thin spray film application depths, in the 0.0002 cm to 0.002 cm range, are measured by portable, commercially available, light density measuring device used in conjunction with glass plate or photographic film. Method is automated by using mechanical/electrical control for shutting off film applicator at desired densitometer reading. |
| NASA分類 | FABRICATION TECHNOLOGY |
| レポートNO | 71B10062
MFS-20842 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/501627 |
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