タイトル | Tool samples subsurface soil free of surface contaminants |
本文(外部サイト) | http://hdl.handle.net/2060/19670000473 |
著者(英) | Wooley, B. C.; Kemmerer, W. W. |
発行日 | 1967-11-01 |
言語 | eng |
内容記述 | Sampling device obtains pure subsurface soil that is free of any foreign substance that may exist on the surface. It is introduced through a contaminated surface area in a closed condition, opened, and a subsurface sample collected, sealed while in the subsurface position, and then withdrawn. |
NASA分類 | MECHANICS |
レポートNO | 67B10473 MSC-10988 |
権利 | No Copyright |
URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/503701 |
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