| タイトル | Pupil Alignment Measuring Technique and Alignment Reference for Instruments or Optical Systems |
| 本文（外部サイト） | http://hdl.handle.net/2060/20100033608 |
| 著者（英） | Hagopian, John G. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2010-09-01 |
| 言語 | eng |
| 内容記述 | A technique was created to measure the pupil alignment of instruments in situ by measuring calibrated pupil alignment references (PARs) in instruments. The PAR can also be measured using an alignment telescope or an imaging system. PAR allows the verification of the science instrument (SI) pupil alignment at the integrated science instrument module (ISIM) level of assembly at ambient and cryogenic operating temperature. This will allow verification of the ISIM+SI alignment, and provide feedback to realign the SI if necessary. |
| NASA分類 | Instrumentation and Photography |
| レポートNO | GSC-15783-1 |
| 権利 | Copyright, Distribution under U.S. Government purpose rights |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/505951 |
