| タイトル | Durability of Electrochromic Devices: Background on Durability Testing and Analysis of ECWs for Terrestrial Applications |
| 著者（英） | Czanderna, A. W. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1999-01-01 |
| 言語 | eng |
| 内容記述 | The task mission of the Electromic Windows (ECW) is to identify, understand, and then mitigate the causes of changes in materials that alter crucial properties and reduce the performance and/or limit the service life of the ECW, and develop new or improved materials that offer greater promise for ECW life expectancy of 20 years or more. |
| NASA分類 | Electronics and Electrical Engineering |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/510424 |
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