| タイトル | Vision inspection system and method |
| 本文（外部サイト） | http://hdl.handle.net/2060/20080004621 |
| 著者（英） | Huber, Edward D.; Williams, Rick A. |
| 著者所属（英） | Lockheed Missiles and Space Co. |
| 発行日 | 1997-10-21 |
| 言語 | eng |
| 内容記述 | An optical vision inspection system (4) and method for multiplexed illuminating, viewing, analyzing and recording a range of characteristically different kinds of defects, depressions, and ridges in a selected material surface (7) with first and second alternating optical subsystems (20, 21) illuminating and sensing successive frames of the same material surface patch. To detect the different kinds of surface features including abrupt as well as gradual surface variations, correspondingly different kinds of lighting are applied in time-multiplexed fashion to the common surface area patches under observation. |
| NASA分類 | Optics |
| 権利 | No Copyright |
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