| タイトル | Tape recorder failure investigation |
| 本文（外部サイト） | http://hdl.handle.net/2060/19960025599 |
| 著者（英） | Loewenthal, S. H.; Carnahan, C. C.; Snyder, G. L.; Higgins, M. D. |
| 著者所属（英） | Lockheed Martin Missile and Space |
| 発行日 | 1996-05-01 |
| 言語 | eng |
| 内容記述 | Two end-item tape recorders lost 4:1 mode data recording mode capability at less than half of their 1 6,000-cycle, 4-year operating life. Subsequent life tests on two spare recorders also experienced 4:1 mode data loss at 8,000 and 11,700 cycles. Tear down inspection after completion of the life tests showed that the tape had worn through the alfesil record and reproduce heads. An investigation was initiated to understand the cause of excessive tape head wear and the reasons why the 4:1 mode data rate, low-speed mode is more damaging than the 1:1 mode data rate, high-speed recording mode. The objective was to establish how operating conditions (tape speed, humidity, temperature, stop/start cycles) affects head life with the goal of extending head life on the remaining in-service tape recorders. Another interest was to explain why an earlier vendor life test showed capability beyond 16,000 cycles. |
| NASA分類 | Instrumentation and Photography |
| レポートNO | 96N27605 |
| 権利 | No Copyright |
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