| タイトル | Trends in parts susceptibility to single event upset from heavy ions |
| 著者（英） | Price, W. E.; Waskiewicz, A. E.; Nichols, D. K.; Kolasinski, W. A.; Blandford, J. T., Jr.; Koga, R.; Pickel, J. C. |
| 著者所属（英） | Aerospace Corp.|Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1986-05-15 |
| 言語 | eng |
| 内容記述 | New test data from the Jet Propulsion Laboratory (JPL), The Aerospace Corporation, Rockwell International (ANAHEIM) and IRT have been combined with published data of JPL and Aerospace to form a nearly comprehensive body of single event upset (SEU) test data for heavy ion irradiations. This data has been arranged to exhibit the SEU susceptibility of devices by function, technology and manufacturer. Clear trends emerge which should be useful in predicting future device performance. |
| NASA分類 | ATOMIC AND MOLECULAR PHYSICS |
| レポートNO | 87N18408
ATR-86(8139)-1 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/528362 |
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