| タイトル | A Low-Noise NbTiN Hot Electron Bolometer Mixer |
| 本文（外部サイト） | http://hdl.handle.net/2060/20020038955 |
| 著者（英） | Sridharan, T. K.; Megerian, Krikor; Tong, C. Edward; Stern, Jeffrey; Gibson, Hugh; LeDuc, Henry; Blundell, Raymond |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 2001-12-01 |
| 言語 | eng |
| 内容記述 | Hot electron bolometer (HEB) mixer elements, based on niobium titanium nitride (NbTiN) thin film technology, have been fabricated on crystalline quartz substrates over a 20 nm thick AlN buffer layer. The film was patterned by optical lithography, yielding bolometer elements that measure about 1 micrometer long and between 2 and 12 micrometers wide. These mixer chips were mounted in a fixed-tuned waveguide mixer block, and tested in the 600 and 800 GHz frequency range. The 3-dB output bandwidth of these mixers was determined to be about 2.5 GHz and we measured a receiver noise temperature of 270 K at 630 GHz using an intermediate frequency of 1.5 GHz. The receiver has excellent amplitude stability and the noise temperature measurements are highly repeatable. An 800 GHz receiver incorporating one of these mixer chips has recently been installed at the Sub-Millimeter Telescope in Arizona for field test and for astronomical observations. |
| NASA分類 | Electronics and Electrical Engineering |
| 権利 | No Copyright |
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