| タイトル | In Situ Monitoring of Crystal Growth Using Mephisto |
| 著者（英） | Lian, Y.; Timchenko, V.; Chen, P. Y. P.; deVahlDavis, G.; Abbaschian, Reza; Leonardi, E.; deGroh, H., III |
| 著者所属（英） | NASA Glenn Research Center |
| 発行日 | 2001-03-01 |
| 言語 | eng |
| 内容記述 | Experiments were carried out to study the morphological stability of Bi-1atomic% Sn alloys using the MEPHISTO directional solidification apparatus aboard Space Shuttle Columbia (STS-87, launched November 19, 1997). The research program involved collaboration of the University of Florida, Centre National d'Etudes Spatiales (France), NASA/Glenn Research Center, the National Institute of Standards and Technology, and the University of New South Wales (Australia). The experiments made use of the Seebeck technique to measure the interface temperature, the resistance change across the sample for determination of the interface velocity, and Peltier current pulsing for demarcation of the interface shape. These data were obtained in real-time during various melting/solidification cycles, and the experiments were controlled via telecommands. The Seebeck signal and temperature measurements in the space experiments, as well as morphological behavior of the solid/liquid interface, were found to be significantly different than those obtained from ground-based studies. For the space-based experiments, interface breakdown was observed at growth velocities of 6.7, 27, and 40 micrometers/s, but not at 1.8 and 3.3 micrometers/s. The results further indicate that the morphological stability threshold for some grain orientations is significantly enhanced, resulting in a staggered planar to cellular transition front. This report summarizes some of these findings. |
| NASA分類 | Solid-State Physics |
| 権利 | No Copyright |
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