| タイトル | Wiltech Component Cleaning and Refurbishment Facility CFC Elimination Plan at NASA Kennedy Space Center |
| 本文（外部サイト） | http://hdl.handle.net/2060/19990075902 |
| 著者（英） | Aurigema, Andrew; Aman, Bob; Melendez, Orlando; Williamson, Steve |
| 著者所属（英） | NASA Kennedy Space Center |
| 発行日 | 1999-04-01 |
| 言語 | eng |
| 内容記述 | The Wiltech Component Cleaning & Refurbishment Facility (WT-CCRF) at NASA Kennedy Space Center performs precision cleaning on approximately 200,000 metallic and non metallic components every year. WT-CCRF has developed a CFC elimination plan consisting of aqueous cleaning and verification and an economical dual solvent strategy for alternative solvent solution. Aqueous Verification Methodologies were implemented two years ago on a variety of Ground Support Equipment (GSE) components and sampling equipment. Today, 50% of the current workload is verified using aqueous methods and 90% of the total workload is degreased aqueously using, Zonyl and Brulin surfactants in ultrasonic baths. An additional estimated 20% solvent savings could be achieved if the proposed expanded use of aqueous methods are approved. Aqueous cleaning has shown to be effective, environmentally friendly and economical (i.e.. cost of materials, equipment, facilities and labor). |
| NASA分類 | Engineering (General) |
| 権利 | No Copyright |
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