| タイトル | A Comparative Study of Heavy Ion and Proton Induced Bit Error Sensitivity and Complex Burst Error Modes in Commercially Available High Speed SiGe BiCMOS |
| 著者（英） | Campbell, Art; Riggs, Pam; Randall, Barb; Fritz, Karl; Reed, Robert; Carts, Marty; Currie, Steve; Seidleck, Christina; Ladbury, Ray; Marshall, Paul |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2004-01-01 |
| 言語 | eng |
| 内容記述 | A viewgraph presentation that reviews recent SiGe bit error test data for different commercially available high speed SiGe BiCMOS chips that were subjected to various levels of heavy ion and proton radiation. Results for the tested chips at different operating speeds are displayed in line graphs. |
| NASA分類 | Computer Operations and Hardware |
| 権利 | No Copyright |
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