| タイトル | Behavior of HfB2-SiC Materials in Simulated Re-Entry Environments |
| 著者（英） | Squire, Tom; Martinez, Ed; Irby, Edward; Gunsman, Michael; Gasch, Matthew; Ellerby, Don; Beckman, Sarah; Ridge, Jerry; Olejniczak, Joe; Johnson, Sylvia M. |
| 著者所属（英） | NASA Ames Research Center |
| 発行日 | 2003-01-01 |
| 言語 | eng |
| 内容記述 | The objectives of this research are to: 1) Investigate the oxidation/ablation behavior of HfB2/SiC materials in simulated re-entry environments; 2) Use the arc jet test results to define appropriate use environments for these materials for use in vehicle design. The parameters to be investigated include: surface temperature, stagnation pressure, duration, number of cycles, and thermal stresses. |
| NASA分類 | Chemistry and Materials (General) |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/544612 |
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