| タイトル | Monte Carlo Treatment of Displacement Damage in Bandgap Engineered HgCdTe Detectors |
| 著者（英） | Jun, Insoo; Xapsos, Michael A.; Fodness, Bryan C.; Burke, Edward A.; Jordan, Thomas M.; Marshall, Paul W.; Pickel, James C.; Reed, Robert A. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2003-01-01 |
| 言語 | eng |
| 内容記述 | The conclusion are: 1. Description of NIEL calculation for short, mid, and longwave HgCdTe material compositions. 2. Full recoil spectra details captured and analyzed Importance of variance in high Z materials. 3. Can be applied directly to calculate damage distributions in arrays. 4. Future work will provide comparisons of measured array damage with calculated NIEL and damage energy distributions. 5. Technique to assess the full recoil spectrum behavior is extendable to other materials. |
| NASA分類 | Computer Operations and Hardware |
| 権利 | Copyright, Distribution as joint owner in the copyright |
|
