タイトル | Advanced Control Surface Seal Development at NASA GRC for 3rd Generation RLV |
著者(英) | Dunlap, Patrick H., Jr.; Breen, Daniel P.; DeMange, Jeffrey J.; Steinetz, Bruce M. |
著者所属(英) | NASA Glenn Research Center |
発行日 | 2002-11-12 |
言語 | eng |
内容記述 | NASA's Glenn Research Center (GRC) is developing advanced control surface seal technologies for the 3rd Generation RLV program. GRC has designed several new test rigs to simulate the temperatures, pressures, and scrubbing conditions that seals would have to endure during service. A hot compression test rig and hot scrub test rig are being developed to perform tests at temperatures up to 3000 F. Another new test rig allows simultaneous seal flow and scrub tests at room temperature to evaluate changes in seal performance with scrubbing. High temperature ceramic preloading devices are being developed and evaluated as ways to improve seal resiliency. |
NASA分類 | Quality Assurance and Reliability |
権利 | Copyright, Distribution as joint owner in the copyright |
URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/545244 |