| タイトル | Novel Sample-handling Approach for XRD Analysis with Minimal Sample Preparation |
| 著者（英） | Blake, D.; Sarrazin, P.; Feldman, S.; Chipera, S.; Bish, D.; Bryson, C.; Vaniman, D. |
| 著者所属（英） | NASA Ames Research Center |
| 発行日 | 2004-01-01
2004 |
| 言語 | eng |
| 内容記述 | Sample preparation and sample handling are among the most critical operations associated with X-ray diffraction (XRD) analysis. These operations require attention in a laboratory environment, but they become a major constraint in the deployment of XRD instruments for robotic planetary exploration. We are developing a novel sample handling system that dramatically relaxes the constraints on sample preparation by allowing characterization of coarse-grained material that would normally be impossible to analyze with conventional powder-XRD techniques. |
| NASA分類 | Lunar and Planetary Science and Exploration |
| 権利 | Copyright, Distribution under U.S. Government purpose rights |
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