| タイトル | Supercritical CO2 Cleaning for Planetary Protection and Contamination Control |
| 著者（英） | Chung, Shirley; Aveline, David; Lin, Ying; Schubert, Wayne; Mennella, Jerami; Zhong, Fang; Anderson, Mark |
| 発行日 | 2010-03-06 |
| 言語 | eng |
| 内容記述 | We have designed and built a prototype Supercritical CO? Cleaning (SCC) system at JPL. The key features of the system are: 1) the parts inside a high-pressure vessel can be rotated at high speeds; 2) the same thermodynamic condition is maintained during First-In First-Out flushing to keep solvent power constant; and 3) the boil-off during decompression is induced in a separate vessel downstream. Our goal is to demonstrate SCC's ability to remove trace amounts of microbial and organic contaminants down to parts per billion levels from spacecraft material surfaces for future astrobiology missions. The initial cleaning test results showed that SCC can achieve cleanliness levels of 0.01 microgram/cm(sup 2) or less for hydrophobic contaminants such as dioctyl phthalate and silicone and it is less effective in the removal and inactivation of the hydrophilic bacterial spores as expected. However, with the use of a polar co-solvent, the efficacy may improve dramatically. The same results were obtained using liquid CO?. This opens up the possibility of using subcritical cleaning conditions, which may prove to be more compatible with certain spacecraft hardware. |
| NASA分類 | Lunar and Planetary Science and Exploration; Environment Pollution |
| 権利 | Copyright |
|
