| タイトル | Use of Proton SEE Data as a Proxy for Bounding Heavy-Ion SEE Susceptibility |
| 本文（外部サイト） | http://hdl.handle.net/2060/20150018092 |
| 著者（英） | Ladbury, Raymond L.; Lauenstein, Jean-Marie; Hayes, Kathryn P. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2015-07-13 |
| 言語 | eng |
| 内容記述 | Although heavy-ion single-event effects (SEE) pose serious threats to semiconductor devices in space, many missions face difficulties testing such devices at heavy-ion accelerators. Low-cost missions often find such testing too costly. Even well funded missions face issues testing commercial off the shelf (COTS) due to packaging and integration. Some missions wish to fly COTS systems with little insight into their components. Heavy-ion testing such parts and systems requires access to expensive and hard-to-access ultra-high energy ion accelerators, or significant system modification. To avoid these problems, some have proposed using recoil ions from high-energy protons as a proxy to bound heavy-ion SEE rates. |
| NASA分類 | Electronics and Electrical Engineering |
| レポートNO | GSFC-E-DAA-TN24781 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
