| タイトル | Reliability Assessment of Wide Bandgap Power Devices |
| 本文（外部サイト） | http://hdl.handle.net/2060/20150021852 |
| 著者（英） | Boomer, Kristen; Casey, Megan; Lauenstein, Jean-Marie; Scheick, Leif; Hammoud, Ahmad |
| 著者所属（英） | NASA Glenn Research Center |
| 発行日 | 2015-06-23 |
| 言語 | eng |
| 内容記述 | No abstract available |
| NASA分類 | Quality Assurance and Reliability; Electronics and Electrical Engineering |
| レポートNO | GRC-E-DAA-TN24519 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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