| タイトル | Thermal Interface Materials Selection and Application Guidelines: In Perspective of Xilinx Virtex-5QV Thermal Management |
| 本文（外部サイト） | http://hdl.handle.net/2060/20160001771 |
| 著者（英） | Tseng, Stephen; Suh, Jong-ook; Dillon, R. Peter |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 2015-08-01 |
| 言語 | eng |
| 内容記述 | The heat from high-power microdevices for space, such as Xilinx Virtex 4 and 5 (V4 and V5), has to be removed mainly through conduction in the space vacuum environment. The class-Y type packages are designed to remove the heat from the top of the package, and the most effective method to remove heat from the class-Y type packages is to attach a heat transfer device on the lid of the package and to transfer the heat to frame or chassis. When a heat transfer device is attached to the package lid, the surfaces roughness of the package lid and the heat transfer device reduces the effective contact area between the two. The reduced contact area results in increased thermal contact resistance, and a thermal interface material is required to reduce the thermal contact resistance by filling in the gap between the surfaces of the package lid and the heat transfer device. The current report describes JPL's FY14 NEPP task study on property requirements of TIM and impact of TIM properties on the packaging reliability. The current task also developed appratuses to investigate the performances of TIMs in the actual mission environment. |
| NASA分類 | Fluid Mechanics and Thermodynamics |
| レポートNO | JPL-Publ-15-02 |
| 権利 | Copyright, Distribution under U.S. Government purpose rights |
