| タイトル | 高分解能・交番磁気力顕微鏡の開発とその磁性材料・磁気デバイスへの応用 |
| その他のタイトル | Development of high-resolution alternating magnetic force microscopy and its application to advanced magnetic materials and devices |
| 参考URL | http://hdl.handle.net/10295/2989 |
| 著者（日） | 齊藤, 準 |
| 著者（英） | Saito, Hitoshi |
| 著者所属（日） | 秋田大学大学院工学資源学研究科附属理工学研究センター |
| 著者所属（英） | Research Center for Engineering Science, Graduate School of Engineering and Resource Science, Akita University |
| 発行日 | 2015-10 |
| 発行機関など | 秋田大学大学院工学資源学研究科
Graduate School of Engineering and Resource Science, Akita University |
| 刊行物名 | 秋田大学大学院工学資源学研究科研究報告 |
| 号 | 36 |
| 開始ページ | 1 |
| 終了ページ | 7 |
| 刊行年月日 | 2015-10 |
| 言語 | jpn
eng |
| 抄録 | We have developed novel magnetic force microscopy named as alternating magnetic force microscopy (A-MFM) for DC and AC magnetic fields imaging with ultra high spatial resolution of less than 5 nm. A-MFM utilizes frequency modulation of cantilever oscillation induced by applying off-resonant alternating magnetic force to high sensitive homemade magnetic tip. A-MFM is the first magnetic force microscopy which enables near-surface magnetic imaging. A-MFM has several new functionalities such as, a) zero detection of magnetic field, b) polarity detection of magnetic field, c) stroboscopic AC magnetic field imaging and d) vector DC magnetic fields imaging with selectable measuring axis. |
| 内容記述 | 形態: カラー図版あり
Physical characteristics: Original contains color illustrations |
| 資料種別 | Departmental Bulletin Paper |
| NASA分類 | Instrumentation and Photography |
| ISSN | 2186-1382 |
| NCID | AA12500403 |
| SHI-NO | AA1540460000 |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/559135 |
