| タイトル | Small Particulate Contamination Survey Of Genesis Flight Sample 61423 |
| 本文（外部サイト） | http://hdl.handle.net/2060/20160003153 |
| 著者（英） | Gonzalez, C. P.; Kuhlman, K. R.; Burnett, D. S.; Schmeling, M.; Allton, J. H.; Allums, K. K. |
| 著者所属（英） | NASA Johnson Space Center |
| 発行日 | 2016-03-21 |
| 言語 | eng |
| 内容記述 | The Genesis mission collected solar wind and brought it back to Earth in order to provide precise knowledge of solar isotopic and elemental compositions. The ions in the solar wind stop in the collectors at depths on the order of 10 to a few hundred nanometers. This shallow implantation layer is critical for scientific analysis of the composition of the solar wind and must be preserved throughout sample handling, cleaning, processing, distribution, preparation and analysis. We continue to work with the community of scientists analyzing Genesis samples using our unique laboratory facilities -- and, where needed, our unique cleaning techniques -- to significantly enhance the science return from the Genesis mission. This work is motivated by the need to understand the submicron contamination on the collectors in the Genesis payload as recovered from the crash site in the Utah desert, and -- perhaps more importantly -- how to remove it. We continue to evaluate the effectiveness of the wet-chemical "cleaning" steps used by various investigators, to enable them to design improved methods of stripping spacecraft and terrestrial contamination from surfaces while still leaving the solar-wind signal intact. |
| NASA分類 | Solar Physics; Inorganic, Organic and Physical Chemistry |
| レポートNO | JSC-CN-35156 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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