| タイトル | Catastrophic Impact of Silicon on Silicon: Unraveling the Genesis Impact Using Sample 61881 |
| 本文（外部サイト） | http://hdl.handle.net/2060/20160003152 |
| 著者（英） | Allums, K. K.; Jurewicz, A. J. G.; Kim, H.; Kuhlman, K. R.; Gonzalez, C. P. |
| 著者所属（英） | NASA Johnson Space Center |
| 発行日 | 2016-03-21 |
| 言語 | eng |
| 内容記述 | The Genesis mission collected solar wind and brought it back to Earth in order to provide precise knowledge of solar isotopic and elemental compositions. The ions in the solar wind were stopped in the collectors at depths on the order of 10 to a few hundred nanometers. This shallow implantation layer is critical for scientific analysis of the composition of the solar wind and must be preserved throughout sample handling, cleaning, processing, distribution, preparation and analysis. The current work is motivated by the need to understand the interaction of the Genesis payload with contamination during the crash in the Utah desert. Silicon contamination has been found to be notoriously difficult to remove from silicon samples despite multiple cleanings with multiple techniques. However, the question has been posed, "Does the silicon really need to be removed for large area analyses?." If the recalcitrant silicon contamination is all pure silicon from fractured collectors, only a very tiny fraction of that bulk material will contain solar wind, which could skew the analyses. This could be complicated if the silicon trapped other materials and/or gases as it impacted the surface. |
| NASA分類 | Space Sciences (General); Solar Physics |
| レポートNO | JSC-CN-35157 |
| 権利 | Copyright, Distribution under U.S. Government purpose rights |
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