| タイトル | Failure analysis of thin-film amorphous-silicon solar-cell modules |
| 本文（外部サイト） | http://hdl.handle.net/2060/19850024139 |
| 著者（英） | Kim, Q. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1984-10-01 |
| 言語 | eng |
| 内容記述 | A failure analysis of thin film amorphous silicon solar cell modules was conducted. The purpose of this analysis is to provide information and data for appropriate corrective action that could result in improvements in product quality and reliability. Existing techniques were expanded in order to evaluate and characterize degradational performance of a-Si solar cells. Microscopic and macroscopic defects and flaws that significantly contribute to performance degradation were investigated. |
| NASA分類 | ENERGY PRODUCTION AND CONVERSION |
| レポートNO | 85N32452 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/566797 |
