| タイトル | Nickel-cadmium cell life test |
| 本文（外部サイト） | http://hdl.handle.net/2060/19850023090 |
| 著者（英） | Coates, D. K.; Wheeler, J. R. |
| 著者所属（英） | Eagle-Picher Industries, Inc. |
| 発行日 | 1985-07-01 |
| 言語 | eng |
| 内容記述 | Over 6,9000 Low Earth Orbit cycles were accumulated at 30% Depth of Discharge on twelve INTELSAT-design nickel-hydrogen cells. Physical equipment and cells are described. Performance characteristics are seen to be uniform. Further testing is planned to seek a failure mode, and also to investigate the effects of a new additive for nickel-hydrogen cells. Initial results indicate improved performance at higher temperatures and diminished swelling of positive nickel plates. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 85N31403 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/566896 |
