| タイトル | Nickel Cadmium Cell Design Variable Program Data Analysis |
| 本文（外部サイト） | http://hdl.handle.net/2060/19850023074 |
| 著者（英） | Morrow, G. W. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 1985-07-01 |
| 言語 | eng |
| 内容記述 | A program was undertaken to evaluate eight of the more important nickel-cadmium cell designs that are currently being used or that have been used during the past 15 years. Design variables tested in this program included teflonated negative plates, silver treated negative plates, light plate loading level, no positive plate cadmium treatment, plate design of 1968, utilizing both old and new processing techniques, and electrochemically impregnated positive plates. The data acquired from these test packs in a low Earth orbit cycling regime is presented and analyzed here. This data showed conclusively that the cells manufactured with no positive plate cadmium treatment outperformed all other cell designs in all aspects of the program and that the cells with teflonated negative electrodes performed very poorly. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 85N31387 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/566912 |
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