| タイトル | Electron irradiation of tandem junction solar cells |
| 本文（外部サイト） | http://hdl.handle.net/2060/19790024486 |
| 著者（英） | Scott-Monck, J. A.; Anspaugh, B. E.; Miyahira, T. F. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1979-08-01 |
| 言語 | eng |
| 内容記述 | The electrical behavior of 100 micron thick tandem junction solar cells manufactured by Texas Instruments was studied as a function of 1 MeV electron fluence, photon irradiation, and 60 C annealing. These cells are found to degrade rapidly with radiation, the most serious loss occurring in the blue end of the cell's spectral response. No photon degradation was found to occur, but the cells did anneal a small amount at 60 C. |
| NASA分類 | ENERGY PRODUCTION AND CONVERSION |
| レポートNO | 79N32657 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/569031 |
