| タイトル | Compendium of Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center |
| 本文（外部サイト） | http://hdl.handle.net/2060/20160009071 |
| 著者（英） | LaBel, Kenneth A.; Cochran, Donna J.; Gigliuto, Robert A.; Pellish, Jonathan A.; O’Bryan, Martha V.; Boutte, Alvin J.; Wilcox, Edward P.; Lauenstein, Jean-Marie; Violette, Daniel; Campola, Michael J.; Ladbury, Raymond L.; Xapsos, Michael A.; Chen, Dakai; Alt, Shannon; Casey, Megan C. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2016-07-11 |
| 言語 | eng |
| 内容記述 | Total ionizing dose and displacement damage testing is performed to characterize and determine the suitability of candidate electronics for NASA spacecraft and program use. |
| NASA分類 | Electronics and Electrical Engineering; Spacecraft Design, Testing and Performance |
| レポートNO | GSFC-E-DAA-TN33481 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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